Testing CMOS Digital ICs with Analog Techniques
نویسندگان
چکیده
In this thesis three novel analog techniques for testing CMOS Integrated circuits are presented. These techniques are based on analog circuits since they offer a number of important advantages compared to standard digital test techniques, such us less silicon area, lower power consumption and high operating speed. Therefore, the proposed techniques can be embedded in the circuit under test, contributing to the design of more reliable circuits.
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